- Participants :Atsuko Miyaji(A.Prof), Atsushi Waseda(D4), Takeshi Kiyomiya(M2), Kenji Mizosoe(M1)
Held in Kikai-Shinkou-Kaikan on the foot of Tokyo-tower. The number
of assembly is approximately 35. The contents are follows: The problem
of template matching test in the testing randomess by NIST, Side channel
attascks against FPGA, New efficient Voting Scheme based on pairing, and
so on. There are many presentation about Protocol.